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chip-level radiation-induced soft error rates that is fast and reasonably accurate is.  N. Miskov-Zivanov and D. Marculescu, “Modeling and optimization of soft – error reliability of sequential circuits,” IEEE Transactions on Computer-Aided.
Dynamic random-access memory (DRAM) is a type of random-access memory that stores each bit of data in a separate capacitor within an integrated circuit.
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Apr 1, 2016. A parallel SER (soft error rate) evaluation framework ASSET-VLG. Compared with spice, the modeling method of ASSET-VLG provides 98% accuracy. optimization for soft-error reliability of sequential circuits, IEEE Trans.
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Modeling and Optimization for Soft-Error Reliability of Sequential Circuits. modeling based on binary. Optimization for Soft-Error Reliability.
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Modeling and Optimization for Soft-Error Reliability of Sequential Circuits Abstract: Due to reduction in device feature size and supply voltage,
Modeling and Optimization for Soft-Error Reliability of Sequential Circuits. Modeling and Optimization for Soft-Error Reliability of Sequential Circuits:
803. Modeling and Optimization for Soft-Error. Reliability of Sequential Circuits. Natasa Miskov-Zivanov, Student Member, IEEE, and Diana Marculescu, Member.
PDF Modeling and Optimization for Soft-Error Reliability of. – Index Terms – combinational logic circuits, reliability, sequential logic circuits, symbolic manipulation. Modeling and Optimization for Soft-Error Reliability of
It’s a circuit called a back-sampling chain that has, for the first time, allowed them to reconstruct the strike pulse—called a single event transient—resulting from the radiation strike. In research to be presented in June at the IEEE VLSI.
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Thesis Title: Probabilistic Modeling and Optimization for Circuit Reliability. [ T24] “Soft Error Rate Analysis for Sequential Circuits,” Conference on Design,
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